Trace analysis :  physical methods 

 - New York :  John Wiley & Sons, Inc.,  1965 
 - xx, 582 p. :  il. 
<br/><br/>p. 504-509 
<br/><br/><label>Subjects--Topical Terms: </label><br/>QUIMICA ANALITICA<br/>OLIGOELEMENTOS
<br/><br/><label>Dewey Class. No.: </label>572.515  / T759