Elements of X-ray diffraction / Bernard Dennis Cullity
Tipo de material:
TextoSeries Addison-Wesley metallurgy seriesEditor: Reading, Mass. : Addison-Wesley Pub., 1956-1978Descripción: 514 páginas : ilustracionesTipo de contenido: texto Tipo de medio: no mediado Tipo de portador: volumenTema(s): RAYOS X -- DIFRACCION | RAYOS X -- METODOS EXPERIMENTALESClasificación CDD: 535.66
Contenidos:
Properties of X-rays-- Geometry of crystals-- Diffraction I: directions of diffracted beams-- Diffraction II: intensities of diffracted beams-- Laue photographs-- Powder photographs-- Diffractometer and spectrometer measurements-- Orientation and quality of single crystals-- Structure of polycrystalline aggregates-- Determination of crystal structure-- Precise parameter measurements-- Phase-diagram determination-- Order-disorder transformations-- Chemical analysis by X-ray diffraction-- Chemical analysis by X-ray spectrometry-- Measurement of residual stress
| Tipo de ítem | Biblioteca actual | Colección | número de clasificación | Copia número | Estado | Fecha de vencimiento | Código de barras |
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Libro General
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Biblioteca Central | Colección General | 535.66 C96 1956 (Navegar estantería(Abre debajo)) | 1 | Disponible | 35609000317070 | |
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Libro General
|
Biblioteca Central | Colección General | 535.66 C96 1978 (Navegar estantería(Abre debajo)) | 1 | Disponible | 35609000628781 |
Properties of X-rays-- Geometry of crystals-- Diffraction I: directions of diffracted beams-- Diffraction II: intensities of diffracted beams-- Laue photographs-- Powder photographs-- Diffractometer and spectrometer measurements-- Orientation and quality of single crystals-- Structure of polycrystalline aggregates-- Determination of crystal structure-- Precise parameter measurements-- Phase-diagram determination-- Order-disorder transformations-- Chemical analysis by X-ray diffraction-- Chemical analysis by X-ray spectrometry-- Measurement of residual stress